Probe station

Description

The Probe station is devoted to accessing fine electrical contacts to measure electrical signals from an IC, MEMS, microsystems, electronic components, etc. for electrical characterization.

Specifications

Up to 6 probes measurement
Probe tips: tungsten, straight, 25 μm
Manual positioner:
- Resolution: 5 μm
- Travel range (X / Y / Z): 8 mm / 6 mm / 25 mm
- Screw resolution (X / Y / Z): 350 μm / 500 μm / 1000 μm
- Mounting: vacuum, magnetic
Electrical connection guarded
Optical microscope.

Applications

The probe station can be used to power an IC or a circuit to check the signal outputs. This tool also allows the characterization of tiny components such as a resistor, capacitor, inductor, diode etc. The measurement can be done using up to 6 points measurement.